The NAND library includes a number of tests. The most useful to
driver writers are readwrite,
rwbenchmark
and
sweccwalk;
the others are only likely to be of interest to library maintainers.
readwrite
Performs a
read-write-erase cycle on the first NAND device it finds, checking that
its operations have had the expected effect on the device contents. This
is a potentially destructive test; do not run it on a device containing
data you care about!
rwbenchmark
A more involved version of readwrite, this is a
timing test which performs multiple reads, writes and erases and
applies statistical techniques to the results in the same way that
tm_basic instruments the speed of various eCos kernel functions.
This is a potentially destructive test; do not run it on a device containing
data you care about!
sweccwalk
Repeatedly makes single-bit changes to a data buffer and checks that the
software ECC implementation correctly repairs them.
Tip: This test can be adapted to test out hardware ECC implementations.
The test outputs the raw ECC codes as it goes, which is useful in
confirming that the bits in the computed ECC are what you think they are.
nandunit
Some unit tests
which do not require any NAND device: ECC known answer vectors, and OOB
area packing/unpacking correctness.
readlimits
Attempts
to read a block outside of a partition, confirming that it doesn't
work.
There are some further tests of the library which
require the synthetic NAND device.
