The STM3210E platform HAL contains some test programs which allow various aspects of the board to be tested.
This program tests the ADC driver for the STM32. The only device connected to the ADC on the board is the potentiometer connected to ADC1 logical channel 14. Therefore this test primarily tests that. However, in addition it also report the values of the temperature sensor and Vrefint inputs that are sourced on-chip. The option CYGBLD_HAL_CORTEXM_STM3210E_EVAL_TEST_ADC must be enabled to run this test since it needs human interaction.
SPI flash test
This program tests the MPC25Pxx serial flash connected to SPI bus 1. It erases, programs and reads a number of sectors in the flash, and should therefore not be run if the flash contains data that should be retained. The CYGPKG_IO_FLASH package must be present and CYGHWR_HAL_CORTEXM_STM32_FLASH_M25PXX enabled to allow this test to be built.
This program tests the I²C driver for the STM32. The only device connected to I²C on the board is the STLM75 temperature sensor on I2C1. The option CYGBLD_HAL_CORTEXM_STM3210E_EVAL_TEST_STLM75 must be enabled to run this test.
NAND ECC walk test
This program is an adapted version of the sweccwalk test in the NAND Flash library which tests the hardware ECC support provided by the on-chip FSMC. It does not affect any data currently stored on the on-board NAND flash chip.